The power of X-ray powder diffaction (XRPD)
Each crystalline material diffracts X-rays in a unique way, so
resulting in a material-characteristic diffraction pattern. If the
material consists of a large amount of crystallites (powder or
polycrystalline sample),
an XRPD pattern is obtained, consisting of diffracted intensities
vs
diffraction angle. An XRPD pattern can be obtained in very short time
and
the analysis of XRPD patterns has many possible applications.
Contact us for conditions :
Dr. René Peschar +31 (0) 20 525 7040 ; r.peschar@uva.nl
Mr. Ed Sonneveld +31 (0) 20 525 6574 ; e.j.sonneveld@uva.nl
Drs. Kees Goubitz +31 (0) 20 525 7038 ; k.goubitz@uva.nl
FAX +31 (0) 20 525 6940
E-MAIL : xrd@science.uva.nl
Address:
XRD-Center
Laboratory for Crystallography
van 't Hoff Institute of Molecular Sciences (HIMS)
Faculty of Sciences
Universiteit van Amsterdam
Valckenierstraat 65
1018 XE Amsterdam
The Netherlands