Photoemission and Photon Sieves: Perspectives for VUV-FEL-Nanospectroscopy

Prof.dr. Lutz Kipp, Institute for Experimental and Applied Physics, Kiel University, Germany

Angle resolved photoemission is todays most effective tool to study the momentum resolved electronic structure of materials. The state of the art will be discussed in the context of high resolution data of clean and nanostructured surfaces of layered materials. In order to overcome todays limitations regarding the lack of spatial resolution we develop improved diffraction optics for use with soft X-ray Free-Electron Lasers. The properties of these 'Photon Sieves' concerning resolution, suppression of secondary maxima and higher orders will be discussed.